Relation between the adhesion strength and interfacial width for symmetric polystyrene bilayers
Relation between the adhesion strength and interfacial width for symmetric polystyrene bilayers
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DOI:
10.1002/polb.21020
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发表时间:
2006-12-15
影响因子:
--
通讯作者:
Nagamura, Toshihiko
中科院分区:
文献类型:
--
作者:
Akabori, Kei-Ichi;Baba, Daisuke;Nagamura, Toshihiko
Polystyrene (PS) bilayers were prepared and were adhered at a temperature between the surface and bulk glass-transition temperatures for a given time. Then, the interfacial adhesion strength (G(L)) was examined with a conventional lapshear measurement. G(L) first increased with increasing adhesion time and then reached a constant value. This result implied that the segments moved across the interface, to a certain depth, even at a temperature below the bulk glass-transition temperature. To confirm this, the interfacial evolution for the PS/deuterated PS bilayers was examined with dynamic secondary-ion mass spectrometry. The G(L) value was linearly proportional to the thickness of the interfacial adhesion layer. Finally, we propose a strategy for regulating the adhesion strength based on the chain-end chemistry. (c) 2006 Wiley Periodicals, Inc.