A 114-AF RMS- Resolution 46-NF/10-MΩ -Range Digital-Intensive Reconfigurable RC-to-Digital Converter with Parasitic-Insensitive Femto-Farad Baseline Sensing

A 114-AF RMS- Resolution 46-NF/10-MΩ -Range Digital-Intensive Reconfigurable RC-to-Digital Converter with Parasitic-Insensitive Femto-Farad Baseline Sensing
复制标题

具有寄生不敏感毫微微法基线传感功能的 114AF RMS 分辨率 46NF/10MΩ 范围数字密集型可重配置 RC 数字转换器

DOI:
--
复制
发表时间:
2018
期刊:
2018 IEEE Symposium on VLSI Circuits
影响因子:
--
通讯作者:
Junghyup Lee
Junghyup Lee
中科院分区:
--
文献类型:
--
作者:
Arup K. George;Wooyoon Shim;M. Je;Junghyup Lee

文献摘要

被引文献

相似文献

本文提出了一种数字密集型动态可重构RC-数字转换器,其输入范围为46 nF/10 MΩ,适用于以时间交错方式阅读R或C传感器。其可重构性还允许毫微微法拉基线电容的寄生不敏感感测。该器件采用0.18 µm CMOS工艺实现,采用摆动升压周期调制(SB-PM)前端,实现114 aFrms的电容分辨率,对应于1 V电源下4.04 pJ/转换步长的FOM。
This paper presents a digital-intensive dynamically reconfigurable RC-to-digital converter with an input range of 46 nF/10 MΩ, suitable for reading out R or C sensors in a time-interleaved way. Its reconfigurability also allows parasitic-insensitive sensing of femto-farad baseline capacitances. Implemented in a 0.18-µm CMOS process, it uses a swing-boosted period-modulation (SB-PM) frontend, achieving a capacitance resolution of 114 aFrms corresponding to an FOM of 4.04 pJ/conversion-step from a 1-V supply.