Structural study on (CH3)2S/Cu(100) by near edge x-ray absorption fine structure and x-ray photoelectron spectroscopy
Structural study on (CH3)2S/Cu(100) by near edge x-ray absorption fine structure and x-ray photoelectron spectroscopy
复制标题
利用近边X射线吸收精细结构和X射线光电子能谱研究(CH3)2S/Cu(100)的结构
DOI：
10.1116/1.1496782
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发表时间：
2002
期刊：
影响因子：
--
通讯作者：
M. Taniguchi
中科院分区：
文献类型：
--
作者：
S. Yagi;Y. Nakano;E. Ikenaga;S. Sardar;J. Syed;K. Soda;E. Hashimoto;Ken'ichiro Tanaka;M. Taniguchi
利用极化依赖S - k边缘近边x射线吸收精细结构（NEXAFS）和x射线光电子能谱（XPS）对（CH3）2S/Cu（100）体系进行了研究。从XPS结果来看，（CH3）2S分子通过硫原子吸附在Cu（100）表面。在亚单层相的S - k边NEXAFS光谱中存在少量的极化依赖性。分子平面的取向角估计为离表面33°。
We have investigated the (CH3)2S/Cu(100) system using polarization dependent S K-edge near edge x-ray absorption fine structure (NEXAFS) and x-ray photoelectron spectroscopy (XPS) for both S 1s and C 1s electrons. From the XPS results, the (CH3)2S molecule is found to adsorb through the sulfur atom on the Cu(100) surface. There is a little polarization dependence in the S K-edge NEXAFS spectra for submonolayer phase. The orientation angle of the molecular plane is estimated to be 33° from the surface.