Imprint Behavior of Ferroelectric Pb(Zr,Ti)O_3 Thin-film Capacitors in the Early Stage
Imprint Behavior of Ferroelectric Pb(Zr,Ti)O_3 Thin-film Capacitors in the Early Stage
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铁电Pb(Zr,Ti)O_3薄膜电容器早期压印行为
DOI:
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发表时间:
2008
期刊:
影响因子:
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通讯作者:
et. al.
中科院分区:
文献类型:
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作者:
S. Okamura;et. al.