RECOMBINATION LINE INTENSITIES FOR HYDROGENIC IONS : THE FINE-STRUCTURE COMPONENTS OF H I AND HE II
RECOMBINATION LINE INTENSITIES FOR HYDROGENIC IONS : THE FINE-STRUCTURE COMPONENTS OF H I AND HE II
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氢离子的复合线强度：H I 和 HE II 的精细结构成分
DOI：
10.1051/aas:1999178
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发表时间：
1999
期刊：
影响因子：
--
通讯作者：
R. Kisielius
中科院分区：
文献类型：
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作者：
R. Clegg;S. Miller;P. Storey;R. Kisielius
发射率已计算选定的UV和光学复合线HI和He II的精细结构组件。给出了在一定范围内的电子温度和密度的结果，以及Baker & Menzel（1938）的情况A和B的结果。相对强度，波长和精细结构的组件的速度移动列表。本文还讨论了它在气体星云光谱中的应用。根据温度、密度和情况，H I和He II的未分辨谱线的中心可以分别移动0.9 km s（-1）和3.3 km s（-1）。本文给出了H α-[N Ⅱ]方法测定电子温度的一种新的刻度。
Emissivities have been calculated for finestructure components of selected UV and optical recombination lines of HI and He II. Results are given for a range of electron temperatures and densities, and in Cases A and B of Baker & Menzel (1938). Relative intensities, wavelengths and velocity shifts of the fine-structure components are tabulated. Applications to the spectra of gaseous nebulae are discussed. Depending on the temperature, density and Case, the centres of unresolved lines can shift by up to 0.9 km s(-1) for H I and 3.3 km s(-1) for He II. A new calibration of the H alpha-[N II] method for determining electron temperatures is given.