A high temperature apparatus for measurement of the Seebeck coefficient
A high temperature apparatus for measurement of the Seebeck coefficient
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DOI：
10.1063/1.3601358
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发表时间：
2011-06-01
影响因子：
1.6
通讯作者：
Snyder, G. Jeffrey
中科院分区：
文献类型：
--
作者：
Iwanaga, Shiho;Toberer, Eric S.;Snyder, G. Jeffrey
设计并制造了一台具有多种特性的高温塞贝克系数测量装置，以最大限度地减少典型误差来源。介绍了温度和电压测量误差的常见来源，并提出了克服这些误差的原则。在这些指导原则的指导下，设计了一种具有单轴四点接触几何结构的高温塞贝克测量装置，该装置可在室温至1200K以上的温度范围内工作。该装置设计简单，适用于物理类型和形状范围广泛的大块样品。(C)2011年美国物理研究所。[DOI：10.1063/1.3601358]
A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes. (C) 2011 American Institute of Physics. [doi:10.1063/1.3601358]