On-Chip Stochastic Detection of Silver Nanoparticles without a Reference Electrode
On-Chip Stochastic Detection of Silver Nanoparticles without a Reference Electrode
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DOI：
10.1021/acssensors.7b00559
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发表时间：
2018-01-01
期刊：
影响因子：
8.9
通讯作者：
Wolfrum, Bernhard
中科院分区：
文献类型：
--
作者：
Figueiredo, Pedro G.;Grob, Leroy;Wolfrum, Bernhard
我们报告了在基于芯片的微电极阵列 (MEA) 上对 20 nm 银纳米粒子的电化学检测，无需传统的参比电极。这是可能的，因为系统开路电位允许银纳米颗粒在磷酸盐缓冲盐水 (PBS) 存在的情况下氧化。通过在溶液中添加抗坏血酸来调节开路电位，有效抑制银纳米粒子事件的检测，证实了这一假设。采用无参考检测概念，我们观察到微电极上的纳米粒子撞击频率与纳米粒子浓度之间的线性关系。这使得银纳米粒子浓度的原位定量可行。所提出的概念非常适合开发简单的芯片实验室或使用点系统，从而能够快速、低成本地筛选纳米颗粒。
We report the electrochemical detection of 20 nm silver nanoparticles at a chip-based microelectrode array (MEA) without the need for a conventional reference electrode. This is possible due to the systems open-circuit potential allowing the oxidation of silver nanoparticles in the presence of phosphate-buffered saline (PBS). The hypothesis is confirmed by modulating the open-circuit potential via addition of ascorbic acid in solution, effectively inhibiting the detection of silver nanoparticle events. Employing the reference-free detection concept, we observe a linear relationship between the nanoparticle impact frequency at the microelectrodes and the nanoparticle concentration. This allows for viable quantification of silver nanoparticle concentrations in situ. The presented concept is ideal for the development of simple lab-on-a-chip or point-of-use systems enabling fast and low-cost screening of nanoparticles.