Quantum size effects in GaAs/GaAsxP1−x strained‐layer superlattices

Quantum size effects in GaAs/GaAsxP1−x strained‐layer superlattices
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GaAs/GaAsxP1−x 应变层超晶格中的量子尺寸效应

DOI:
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发表时间:
1984
期刊:
影响因子:
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通讯作者:
R. M. Biefeld
R. M. Biefeld
中科院分区:
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文献类型:
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作者:
P. Gourley;R. M. Biefeld

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报道了首次在GaAs/GaAs0.5P0.5应变层超晶格(SLS)中观察到的量子尺寸效应。利用激发光谱和光致发光光谱,我们观察到了电子和空穴量子阱激发态之间的光学跃迁。这些观测提供了对GaAs层中的双轴压缩应变、界面粗糙度和GaAs/GaP异质结的价带偏移的测量。
We report the first observations of quantum size effects in GaAs/GaAs0.5P0.5 strained‐layer superlattices (SLS’s). Using excitation and photoluminescence spectroscopies, we have observed optical transitions between excited states of the electron and hole quantum wells. These observations provide a measure of the biaxial compressive strain in the GaAs layers, interfacial roughness, and valence‐band offset for the GaAs/GaP heterojunction.