Scanning transmission electron microscopy: Seeing the atoms more clearly
Scanning transmission electron microscopy: Seeing the atoms more clearly
复制标题
扫描透射电子显微镜：更清晰地观察原子
DOI：
10.1557/mrs.2012.239
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发表时间：
2012
期刊：
影响因子：
5
通讯作者：
S. Pennycook
中科院分区：
文献类型：
--
作者：
S. Pennycook
本文展示了扫描透射式电子显微镜如何提供通常可直接解释的Z-对比度图像(其中Z是原子序数)，并且可以显示比相位对比度图像更高的分辨率。它代表了一种非相干成像模式，类似于一个多世纪前瑞利勋爵为光学显微镜所描述的模式。今天，分辨率已经达到了一半，对单个原子柱进行光谱分析，甚至是对二维材料中的单个原子进行光谱分析已经成为可能。
This article shows how the scanning transmission electron microscope provides a Z-contrast image (where Z is atomic number) that is often directly interpretable and can show higher resolution than a phase-contrast image. It represents an incoherent mode of imaging, similar to that described by Lord Rayleigh for the optical microscope over a century ago. Today, resolution has reached a half Ångstrom, and spectroscopic analysis of individual atomic columns, even of individual atoms in two-dimensional materials, has become possible.
影响因子：
17.1
作者：
Parent, Lucas R.;Robinson, David B.;Woehl, Taylor J.;Ristenpart, William D.;Evans, James E.;Browning, Nigel D.;Arslan, Ilke
通讯作者：
Arslan, Ilke