Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer
Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer
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DOI：
10.3390/app7060584
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发表时间：
2017-06-01
影响因子：
2.7
通讯作者：
Yabashi, Makina
中科院分区：
文献类型：
--
作者：
Inubushi, Yuichi;Inoue, Ichiro;Yabashi, Makina
研制了一种用于自放大自发发射（SASE） x射线自由电子激光（XFEL）脉冲宽范围高分辨率测量的单次x射线光谱仪。该光谱仪由一个多层椭圆反射镜和一个硅（553）分析晶体组成，用于在9070 eV左右产生22 mrad的大发散。我们实现了55 eV的宽能量范围和80 meV的精细光谱分辨率，这使得可以观察到具有完全分辨尖峰结构的整个SASE-XFEL光谱。我们发现一个SASE-XFEL脉冲有大约60个纵向模式，脉冲持续时间为7.7 +/- 1.1 fs。
We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 +/- 1.1 fs.