Image Scanning Microscopy
Image Scanning Microscopy
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DOI：
10.1103/physrevlett.104.198101
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发表时间：
2010-05-14
影响因子：
8.6
通讯作者：
Enderlein, Joerg
中科院分区：
文献类型：
--
作者：
Mueller, Claus B.;Enderlein, Joerg
引入了一种新的显微技术，即图像扫描显微术 (ISM)，它将传统的共焦激光扫描显微术与快速宽视场 CCD 检测相结合。该技术可以使荧光成像的横向光学分辨率加倍。 ISM 背后的物理原理类似于结构照明显微镜，将共焦激光扫描显微镜的分辨率与宽视场成像显微镜的分辨率相结合。这封信描述了ISM的理论基础和实验实现。
A new microscopy technique is introduced, image scanning microscopy (ISM), which combines conventional confocal-laser scanning microscopy with fast wide-field CCD detection. The technique allows for doubling the lateral optical resolution in fluorescence imaging. The physical principle behind ISM is similar to structured illumination microscopy, by combining the resolving power of confocal-laser scanning microscopy with that of a wide-field imaging microscopy. This Letter describes the theoretical foundation and experimental realization of ISM.