X-ray study of SrTiO3 thin films in multilayer structures
X-ray study of SrTiO3 thin films in multilayer structures
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DOI：
10.1016/s0921-5093(00)00846-7
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发表时间：
2000-09-15
期刊：
影响因子：
6.4
通讯作者：
Gevorgyan, SS
中科院分区：
文献类型：
--
作者：
Petrov, PK;Ivanov, ZG;Gevorgyan, SS
利用常规X射线衍射和掠入射X射线衍射技术研究了一组YBa 2Cu 3 O 7-x（YBCO）/SrTiO 3（STO）多层膜结构。对于所有样品，进行Ω和φ扫描。从峰位和峰形展宽分析，a，B，和c的STO薄膜的晶格参数以及沿沿着这些方向的微应变值进行了评估。观察到当在STO薄膜上生长YBCO薄膜时，STO薄膜的晶胞变为正交晶系。缓冲层的引入减小了STO晶胞参数B和a之间的差异，减小了微应变。(C)2000 Elsevier Science S.A. All rights reserved.
A set of YBa2Cu3O7-x (YBCO)/SrTiO3 (STO) multilayer structures are investigated using conventional and grazing-incidence X-ray diffraction techniques. For all samples omega- and phi-scans are performed. From the peak position and broadening analysis of peak shape, the a, b, and c lattice parameters for STO films as well as the microstrain values along these directions are evaluated. It is observed that the crystal cell of the STO film becomes orthorhombic when a YBCO thin film is grown on top of STO. The differences between b and a parameters of STO crystal cell and the microstrain are reduced by using buffer layers. (C) 2000 Elsevier Science S.A. All rights reserved.