Positron annihilation studies of mesoporous silica films using a slow positron beam
Positron annihilation studies of mesoporous silica films using a slow positron beam
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DOI：
10.1016/j.apsusc.2005.08.078
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发表时间：
2006-02-28
影响因子：
6.7
通讯作者：
Kabayashi, Y
中科院分区：
文献类型：
--
作者：
He, CQ;Muramatsu, M;Kabayashi, Y
用正电子湮没寿命谱测量了以三嵌段共聚物（EO_（106）PO_（70）EO_（106））为结构导向剂合成的介孔氧化硅薄膜。正电子寿命谱的不同沉积和煅烧后的薄膜表明，形成的介观结构煅烧后，这是证实了傅里叶变换红外光谱（FTIR）和场发射扫描电子显微镜（FE-SEM）观察。二氧化硅膜的开孔孔隙率或孔互连性可以通过未封端的膜的二维正电子湮没寿命谱来评估。孔径大小和它们的分布在二氧化硅薄膜中被发现的热处理的影响。(c)2005 Elsevier B.V保留所有权利。
Positron annihilation lifetime, spectra were measured for mesoporous silica films, which were synthesized using triblock copolymer (EO106PO70EO106) a; a structure-directing agent. Different positron lifetime spectra for the deposited and calcined films indicated the formation of meso-structure after calcination, which was confirmed by Fourier transform infrared (FTIR) spectra and field emission-scanning electron microscopy (FE-SEM) observation. Open porosity or pore interconnectivity of a silica film might be evaluated by a two-dimensional positron annihilation lifetime spectrum of an uncapped film. Pore sizes and their distributions in the silica films were found to be affected by thermal treatments. (c) 2005 Elsevier B.V All rights reserved.