W.H.Tian: "An application of the x-ray absorption method to thickness measurement in precipitate-containing Ni_3(Al,Ti)and TiAl compounds" philosophical Magazine B. 67. 811-822 (1993)
W.H.Tian: "An application of the x-ray absorption method to thickness measurement in precipitate-containing Ni_3(Al,Ti)and TiAl compounds" philosophical Magazine B. 67. 811-822 (1993)
复制标题
田文华：“X射线吸收法在含沉淀物的Ni_3(Al,Ti)和TiAl化合物厚度测量中的应用”哲学杂志B.67.811-822(1993)
DOI：
--
复制
发表时间：
--
期刊：
影响因子：
--
通讯作者：
中科院分区：
文献类型：
--
作者：
