Diffuse reflectivity measurement using cubic cavity.
Diffuse reflectivity measurement using cubic cavity.
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DOI：
10.1364/ol.39.001941
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发表时间：
2014-04
期刊：
影响因子：
3.6
通讯作者：
Jia Yu;Y. G. Zhang;Q. Gao;Gang Hu;Z. G. Zhang;S. H. Wu
中科院分区：
文献类型：
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作者：
Jia Yu;Y. G. Zhang;Q. Gao;Gang Hu;Z. G. Zhang;S. H. Wu
利用可调谐半导体激光吸收光谱在762 nm处测量氧P11谱线，提出了一种基于变端口分数法的立方腔漫反射率测量方法。提出了一种确定附加路径长度l0的实验方法。测量了具有不同厚度散射膜的立方腔的漫反射率。当漫反射率从0.004(4)增加到0.0003(3)时，漫反射率的误差从0.867减小到0.9887。仿真结果表明，当漫反射系数较高时，漫反射系数的误差有进一步减小的潜力。
A method for measuring diffuse reflectivity using cubic cavity based on the variable port fraction method was developed by measuring oxygen P11 line at 762 nm using tunable diode laser absorption spectroscopy. An experimental method to determine the additional path length l0 was presented. We measured the diffuse reflectivity of a cubic cavity with scattering coatings of different thickness. The error of diffuse reflectivity was reduced from 0.004 to 0.0003 when the diffuse reflectivity increased from 0.867(4) to 0.9887(3). A simulation result manifests that the error of diffuse reflectivity has the potential to be further reduced at higher diffuse reflectivity.