Diffusion model of the impact of helium and argon impurities on deuterium retention in tungsten

Diffusion model of the impact of helium and argon impurities on deuterium retention in tungsten
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DOI:
10.1088/1741-4326/aafe8d
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发表时间:
2019-02
期刊:
影响因子:
3.3
通讯作者:
M. Reinhart;A. Kreter;B. Unterberg;M. Rasinski;C. Linsmeier
M. Reinhart;A. Kreter;B. Unterberg;M. Rasinski;C. Linsmeier
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
M. Reinhart;A. Kreter;B. Unterberg;M. Rasinski;C. Linsmeier

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采用数值扩散模型研究了氦和氩杂质对钨中氘保留率的影响,该模型考虑了氦或氩的影响,处理了氘和氦或氩在钨中的扩散深度分布。在氦的情况下,氦纳米气泡层在样品的表面处建立,其深度高于入射氦和氘离子的穿透深度。纳米气泡形成多孔网络,其允许通过表面复合和通过孔扩散到表面来释放捕获的氘。对于氩,只有一个浅层的氩引起的缺陷存在,这也作为氘的陷阱网站。在线性等离子体装置PSI-2上进行了一些钨样品的实验,以支持该模型。氦和氩以高达8%的比例混合到氘等离子体中,用于其他类似的暴露条件。此外,离子注量的变化进行了调查的发病和演变的杂质的影响。该模型表明,氦纳米气泡以及氩引起的缺陷的氘保留的影响强烈地依赖于氦或氩影响层的厚度和氘离子的渗透深度之间的比率。
The influence of helium and argon impurities on the deuterium retention in tungsten is investigated by a numerical diffusion model, which treats diffusing depth profiles for deuterium and helium or argon in tungsten, taking into account the suggested effects of helium or argon. With helium, a helium nanobubble layer builds up at the surface of the sample, with depths higher than the penetration depth of the incident helium and deuterium ions. The nanobubbles form a porous network, which allows the release of trapped deuterium by surface recombination and diffusion through the pores to the surface. For argon, only a shallow layer of argon-induced defects exists, which also act as trapping sites for deuterium. A number of experiments with tungsten samples were conducted at the linear plasma device PSI-2 in support of the model. Helium and argon were admixed to deuterium plasma in ratios of up to 8% for otherwise similar exposure conditions. In addition, a variation of ion fluences was performed for investigation of the onset and evolution of the effects of impurities. The model shows that the influence on the deuterium retention both for helium nanobubbles as well as for argon-induced defects depends strongly on the ratio between the thickness of the helium- or argon-affected layer and the penetration depth of deuterium ions.