Passive Millimeter-Wave Microscopy
Passive Millimeter-Wave Microscopy
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DOI：
10.1109/lmwc.2009.2029741
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发表时间：
2009-09
影响因子：
3
通讯作者：
T. Nozokido;M. Noto;T. Murai
中科院分区：
文献类型：
--
作者：
T. Nozokido;M. Noto;T. Murai
提出并论证了一种新型的毫米波成像技术--被动毫米波显微技术。被动毫米波成像技术与扫描近场显微镜相结合，能够以低于衍射极限的空间分辨率直接观测从被观察物体发出的热毫米波信号。详细解释了我们工作在Ka波段的被动显微镜系统。给出了用该系统获得的毫米波图像，验证了这种新成像技术的可行性。
A new type of millimeter-wave imaging technique, passive millimeter-wave microscopy is proposed and demonstrated. Passive millimeter-wave imaging techniques when combined with scanning near-field microscopy enable direct observation of millimeter-wave signals thermally emitted from the viewed object with a spatial resolution below the diffraction limit. Details of our passive microscope system operating at Ka-band frequencies are explained. Millimeter-wave images obtained with the system are presented to demonstrate the feasibility of this new imaging technique.