Characterization of Spinel‐Type Cobalt and Nickel Oxide Thin Films by X‐Ray Near Grazing Diffraction, Transmission and Reflectance Spectroscopies, and Cyclic Voltammetry
Characterization of Spinel‐Type Cobalt and Nickel Oxide Thin Films by X‐Ray Near Grazing Diffraction, Transmission and Reflectance Spectroscopies, and Cyclic Voltammetry
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DOI：
10.1149/1.2044193
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发表时间：
1995-06
影响因子：
3.9
通讯作者：
P. Nkeng;G. Poillerat;J. Koenig;P. Chartier;B. Lefez;J. Lopitaux;M. Lenglet
中科院分区：
文献类型：
--
作者：
P. Nkeng;G. Poillerat;J. Koenig;P. Chartier;B. Lefez;J. Lopitaux;M. Lenglet
本文报道了三种分析技术，即X射线近掠射衍射、红外透射和反射光谱以及紫外-可见-近红外反射光谱在钴酸钴（Co 3 O 4）和镍钴酸镍（NiCo 2 O 4）薄膜表征中的应用。用喷涂和溅射两种方法制备了厚度在10-1000 nm范围内的Co 3 O 4和NiCo 2 O 4薄膜。基于理论考虑，特征光谱和厚度限制进行了讨论。相应的循环伏安图，并进行了讨论。在研究薄膜阳离子组成的四种方法中，循环伏安法似乎是最不敏感的。
The application of three analytical techniques, x-ray near grazing diffraction, infrared transmission and reflectance spectroscopy, and UV-visible-near-infrared reflectance spectroscopy, to the characterization of cobalt cobaltite, Co 3 O 4 , and of nickel cobaltite, NiCo 2 O 4 films, is reported. Thin films of Co 3 O 4 and NiCo 2 O 4 , in a 10-1000 nm thickness range were prepared by two methods : spraying and sputtering. Characteristic spectra and thickness limits are discussed based on theoretical considerations. Corresponding cyclic voltammograms are presented and discussed. Among the four methods of investigation of the cationic composition of the films, cyclic voltammetry appears to be the least sensitive.