The reliability of a series system of repairable subsystems: A bayesian approach
The reliability of a series system of repairable subsystems: A bayesian approach
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DOI：
10.1002/1520-6750(199406)41:4
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发表时间：
1994-06
影响因子：
2.3
通讯作者：
F. Hulting;Jeffrey A. Robinson
中科院分区：
文献类型：
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作者：
F. Hulting;Jeffrey A. Robinson
考虑当在部件、子系统和系统级上都有试验数据和历史信息时，对一系列（可能）可修子系统的可靠性进行估计的问题。这样的问题很适合贝叶斯方法。Martz、Waller和Fickas [Technometrics，30，143-154（1988）]提出了一种贝叶斯程序，该程序适用于任何水平的通过/未通过（二项式）数据。然而，其他类型的测试数据通常是可用的，包括（a）不可修复部件的寿命，和（B）可修复子系统的修复历史。在这篇文章中，我们描述了一个新的贝叶斯程序，可容纳通过/失败，寿命和维修数据在任何级别。我们假设寿命数据采用威布尔模型，通过/失败数据采用截尾威布尔模型，维修数据采用幂律过程模型。因此，在每个水平的测试数据可以表示为一个特定形式的两参数似然函数，历史信息可以表示使用共轭族的先验分布。我们讨论了计算问题，并使用该程序来分析车辆系统的可靠性。John Wiley & Sons，Inc.
Consider the problem of estimating the reliability of a series system of (possibly) repairable subsystems when test data and historical information are available at the component, subsystem, and system levels. Such a problem is well suited to a Bayesian approach. Martz, Waller, and Fickas [Technometrics, 30, 143–154 (1988)] presented a Bayesian procedure that accommodates pass/fail (binomial) data at any level. However, other types of test data are often available, including (a) lifetimes of nonrepayable components, and (b) repair histories for repairable subsystems. In this article we describe a new Bayesian procedure that accommodates pass/fail, life, and repair data at any level. We assume a Weibull model for the life data, a censored Weibull model for the pass/fail data, and a power-law process model for the repair data. Consequently, the test data at each level can be represented by a two-parameter likelihood function of a certain form, and historical information can be expressed using a conjugate family of prior distributions. We discuss computational issues, and use the procedure to analyze the reliability of a vehicle system. © 1994 John Wiley & Sons, Inc.