Identification of models using failure rate and mean residual life of doubly truncated random variables
Identification of models using failure rate and mean residual life of doubly truncated random variables
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使用双截断随机变量的故障率和平均剩余寿命识别模型
DOI：
10.1007/bf02778272
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发表时间：
2004
影响因子：
1.3
通讯作者：
S. Sunoj
中科院分区：
文献类型：
--
作者：
Paduthol Godan Sankaran;S. Sunoj
本文研究了双截尾随机变量的失效率与平均剩余寿命之间的关系。因此，我们开发的指数，帕累托II和β分布的特征。进一步，我们推广了Nair和Sankaran（1991）以及Consul（1995）分别给出的Pearson和指数分布族的恒等式。这些措施的长度偏置模型的背景下的应用进行了探讨。
In this paper, we study the relationship between the failure rate and the mean residual life of doubly truncated random variables. Accordingly, we develop characterizations for exponential, Pareto II and beta distributions. Further, we generalize the identities for the Pearson and the exponential family of distributions given respectively in Nair and Sankaran (1991) and Consul (1995). Applications of these measures in the context of lengthbiased models are also explored.