Fabrication of IBAD-MgO and PLD-CeO2 Layers for YBCO Coated Conductors*
Fabrication of IBAD-MgO and PLD-CeO2 Layers for YBCO Coated Conductors*
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DOI：
10.1088/0256-307x/32/7/078102
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发表时间：
2015-07
影响因子：
3.5
通讯作者：
Mu Qingqing;Liu Linfei;Li Yijie
中科院分区：
文献类型：
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作者：
Mu Qingqing;Liu Linfei;Li Yijie
采用离子束辅助（IBAD）方法在Y2O3/Al2O3缓冲C276带上制备了不同结构的MgO薄膜。然后采用脉冲激光沉积（PLD）的方法在iad - mgo薄膜上直接生长CeO2层。研究了iad - mgo织构、衬底温度和厚度对CeO2层晶粒取向的影响。薄膜的表征是通过x射线衍射和原子力显微镜进行的。结果表明，iad - mgo织构对CeO2层的取向和织构程度非常敏感。通过优化iad - mgo织构，CeO2在较宽的衬底温度范围内具有纯净的（002）取向和优异的双轴织构。此外，PLD-CeO2层具有厚度效应。在优化的实验条件下，PLD-CeO2层具有Δ = 2.9°的高面内织构，表面光滑，rms表面粗糙度小于2 nm。在77K和自场条件下，沉积在CeO2层上的0.4 μm厚YBCO薄膜的临界电流密度Jc为6.25 × 106 a /cm2。
MgO thin films with different textures are fabricated by the ion beam assisted (IBAD) method on the Y2O3/Al2O3 buffered C276 tape. Then a CeO2 layer is directly grown on the IBAD-MgO film by the pulsed laser deposition (PLD) method. Effects of IBAD-MgO texture, substrate temperature and thickness on the grain alignment of the CeO2 layer are investigated. Film characterization is performed by x-ray diffraction and atomic force microscopy. It is found that the orientation and texture degree of the CeO2 layer are very sensitive to the IBAD-MgO texture. By optimizing the IBAD-MgO texture, CeO2 has pure (002) orientation and excellent biaxial texture deposited in a broad substrate temperature range. In addition, the PLD-CeO2 layer has a thickness effect. Under the optimized experimental condition, the PLD-CeO2 layer has a high in-plane texture of Δ = 2.9° and a smooth surface with an rms surface roughness of less than 2 nm. The critical current density Jc of a 0.4-μm-thick YBCO film deposited on the CeO2 layer is 6.25 × 106 A/cm2 at 77K and a self-field.