Development and test of a next-generation positron detector
Development and test of a next-generation positron detector
复制标题
下一代正电子探测器的开发和测试
DOI：
10.1088/1742-6596/2462/1/012014
复制
发表时间：
2023
期刊：
影响因子：
--
通讯作者：
T. Ishida,
中科院分区：
文献类型：
--
作者：
Marta Villa de Toro Sanchez;K. M. Kojima;M. Shoji;M. Miyahara;M. Tanaka;R. Honda;T. Ishida,
This report is focused on the development and test of a TDC (time to digital converter) and amplifier circuit for a state-of-the-art positron detector with position sensitivity. A newly developed one chip amplifier-shaper-discriminator (ASD) circuit with 16 channels input and a high-resolution TDC with a timing resolution on the order of picoseconds were tested. Silicon photomultipliers (SiPMs) were employed to give electric pulses for the optical input coming from a pulsed laser. We have successfully controlled the threshold level of the ASD circuit and measured the time structure of the SiPMs, as well as their multiple photon response from the pulse height histogram and the time over the threshold (TOT) histogram measured by the sub-nano second TDC. This is a technical basis for the next generation detector system with the positron tracking capability.
