Diagnosis of high‐brightness ion beams produced in point pinch diodes
Diagnosis of high‐brightness ion beams produced in point pinch diodes
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点夹二极管产生的高亮度离子束的诊断
DOI：
10.1063/1.363522
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发表时间：
1996
影响因子：
3.2
通讯作者：
T. Tazima
中科院分区：
文献类型：
--
作者：
K. Masugata;H. Okuda;K. Yatsui;T. Tazima
对“点箍缩二极管”中产生的离子束和阳极等离子体进行了诊断和评价。根据高分辨率汤姆逊抛物线质谱仪的测量，在二极管间隙中加速的离子包含（a）质子，（B）高度电离的碳和氧离子，以及（c）单电离的中等质量离子，例如碳、氧、CO+2、OH+、H2O+。时间积分的X射线和粒子针孔图像显示电子束在等离子体上的光斑直径小于0.5 mm，其中发现了尺寸小于0.1 mm的精细结构。用晶体光谱仪观察到Al V的Kα卫星线，这表明等离子体中存在Al 4+。
Diagnosis and evaluation have been carried out of the ion beam and anode plasma produced in a ‘‘point pinch diode.’’ From the measurement of a highly resolved Thomson‐parabola mass spectrometer, the ions accelerated in the diode gap contain (a) protons, (b) highly ionized carbon and oxygen ions, and (c) singly ionized medium mass ions such as carbon, oxygen, CO+2, OH+, H2O+. Time‐integrated x‐ray and particle pinhole images show the spot size of the electron beam on the plasma to be less than 0.5 mm in diameter, in which fine structures are found with size less than 0.1 mm. A Kα satellite line of Al V is observed with a crystal spectrograph, which indicates the existence of Al4+ in the plasma.