Absorption Coefficients of Xenon and Argon in the 600–1025 Å Wavelength Regions
Absorption Coefficients of Xenon and Argon in the 600–1025 Å Wavelength Regions
复制标题
氙气和氩气在 600–1025 Å 波长区域的吸收系数
DOI：
--
复制
发表时间：
1963
期刊：
影响因子：
--
通讯作者：
J. C. Larrabee
中科院分区：
文献类型：
--
作者：
R. Huffman;Y. Tanaka;J. C. Larrabee
在2 P ~（32）电离阈值（λ_（1023）; Ar_（787））和600之间的波长处测量了氙和氩的吸收系数。我们最近报道了对氪的类似测量[Appl. Opt.，1963年9月]。在0.5A的带宽下，使用了以Hopfield氦连续源作为背景的光电扫描技术。属于两个重叠系列p6（1 S 0）-p5（2 P 1/2）ns′和p6（1 S 0）-p5（2 P 1/2）nd′的自电离线的振子强度，并且发生在2 P 32和2 P 1/2电离极限之间，从测量的吸收系数曲线计算。前六个Ar峰的总振子强度为0.60±25%，前四个Ar峰的总振子强度为0.011±25%。对于氙，k值在2 P ½阈值处为2100 cm-1±10%，在600 A时平稳下降至1050 cm-1。对于氩，k值在2 P ½阈值处为930±10%，并且曲线在600 A处平滑上升至1200 cm-1。在这两种情况下，没有线或阈值观察到的波长。
Absorption coefficients of xenon and argon have been measured at wavelengths between the 2P32 ionization threshold (Xe, 1023 A; Ar, 787 A) and 600 A. Similar measurements have recently been reported by us for krypton [Appl. Opt., September 1963]. A photoelectric scanning technique with a Hopfield helium continuum source as background was used at a bandwidth of 0.5 A. The oscillator strengths of the auto‐ionized lines which belong to the two overlapping series p6(1S0) —p5(2P½)ns′ and p6(1S0) —p5(2P½)nd′ and which occur between the 2P32 and 2P½ ionization limits were calculated from the measured absorption coefficient curve. The total oscillator strength was 0.60±25% for the first six Xe peaks and 0.011±25% for the first four Ar peaks. For xenon, the k value is 2100 cm—1±10% at the 2P½ threshold, and it drops smoothly to 1050 cm—1 at 600 A. For argon, the k value is 930±10% at the 2P½ threshold, and the curve rises smoothly to 1200 cm—1 at 600 A. In both cases, no lines or thresholds were observed at wavele...