Secondary resonance magnetic force microscopy using an external magnetic field for characterization of magnetic thin films
Secondary resonance magnetic force microscopy using an external magnetic field for characterization of magnetic thin films
复制标题
使用外部磁场表征磁性薄膜的二次共振磁力显微镜
作者：
Dongzi Liu;Kangxin Mo;Xidong Ding;Liangbing Zhao;Guocong Lin;Yueli Zhang;Dihu Chen
