Optical interference method to obtain thickness and refractive indices of a uniaxial medium
Optical interference method to obtain thickness and refractive indices of a uniaxial medium
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光学干涉法获得单轴介质的厚度和折射率
DOI：
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发表时间：
1994
期刊：
影响因子：
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通讯作者：
E. Bernabeu
中科院分区：
文献类型：
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作者：
F. Carreño;J. C. Martínez;E. Bernabeu
光干涉条纹测量弱吸收介质厚度具有快速、准确、无损等优点。当样品的折射率n已知时，它将给出层厚度d。然而，如果n未知，则至少需要两次独立的分光光度测量来获得n和d。提出了一种基于统计的方案来分析干涉图，以确定样品的折射率和厚度。该方法还确定了绝对干涉阶数。该方法固有的主要近似是，该层必须在感兴趣的波长区域内弱吸收和非色散。该方法用于确定光轴平行于面的单轴介质的光学常数。
Optical interference fringe measurements of the thickness of weakly absorbing media can be rapid, accurate, and nondestructive. When the refractive index n of the sample is known, it will give us the layer thickness d. If, however, n is unknown, at least two independent spectrophotometric measurements are needed to obtain both n and d. A statistically based scheme is proposed to analyze the interference pattern in order to determine the refractive index and the thickness of the sample. The absolute interference order is also determined with the proposed technique. The major approximation inherent in the method is that the layer must be weakly absorbing and nondispersive over the wavelength region of interest. The method is applied to determine the optical constants of a uniaxial medium with the optical axis parallel to the faces.