A J-function for marked point patterns
A J-function for marked point patterns
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DOI:
10.1007/s10463-005-0015-7
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发表时间:
2006-06-01
影响因子:
1
通讯作者:
van Lieshout, M. N. M.
中科院分区:
文献类型:
--
作者:
van Lieshout, M. N. M.
We propose a new summary statistic for marked point patterns. The underlying principle is to compare the distance from a marked point to the nearest other marked point in the pattern to the same distance seen from an arbitrary point in space. Information about the range of interaction can be inferred, and the statistic is well-behaved under random mark allocation. We develop a range of Hanisch style kernel estimators to tackle the problems of exploding tail variance earlier associated with J-function plug-in estimators, and carry out an exploratory analysis of a forestry data set.