A new readout scheme for imaging TES based on cooling time measurement
A new readout scheme for imaging TES based on cooling time measurement
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基于冷却时间测量的新型TES成像读出方案
DOI：
10.1063/1.1457656
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发表时间：
2002
期刊：
影响因子：
--
通讯作者：
M. Ohkubo
中科院分区：
文献类型：
--
作者：
Y. Noguchi;H. Takahashi;D. Fukuda;M. Ohno;M. Nakazawa;M. Ataka;M. Ukibe;F. Hirayama;M. Ohkubo
我们正在开发一种用于X射线成像光谱学应用的钨过渡边缘传感器(W-TES)。传统的TES阵列读出方案在读出多通道X射线信号时具有很大的难度。因此，我们考虑了一种新的用于W-TES阵列的读出方案。该方案基于饱和模式下的冷却时间测量。在该方案中，我们只需要时间信息，因此可以预期简化读出系统。虽然我们的W-TES(0.5 mm×0.5 mm)目前使用冷却时间测量获得的能量分辨率在5.9keV时为55 eV(半高宽)，但通过制造更小的器件，有望获得更高的能量分辨率。
We are developing a tungsten transition edge sensor (W-TES) for x-ray imaging spectroscopy applications. The conventional readout scheme for TES array has a great difficulty in reading out multi-channel x-ray signals. Therefore we have considered a new readout scheme for a W-TES array. This scheme is based on a cooling time measurement in a saturation mode. In this scheme, we only need time information, therefore we can expect to simplify a readout system. Although the currently achieved energy resolution of our W-TES (0.5 mm×0.5 mm) using the cooling time measurement is 55 eV (FWHM) at 5.9 keV, much higher energy resolution is expected by making smaller devices.