Enhanced interference-pattern visibility using multislit optical superposition method for imaging-type two-dimensional Fourier spectroscopy
Enhanced interference-pattern visibility using multislit optical superposition method for imaging-type two-dimensional Fourier spectroscopy
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DOI:
10.1364/ao.54.006254
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发表时间:
2015-07-10
期刊:
影响因子:
1.9
通讯作者:
Ishimaru, Ichiro
中科院分区:
文献类型:
--
作者:
Qi, Wei;Suzuki, Yo;Ishimaru, Ichiro
A solution is found for the problem of phase cancellation between adjacent bright points in wavefront-division phase-shift interferometry. To this end, a design is proposed that optimizes the visibility of the interference pattern from multiple slits. The method is explained in terms of Fraunhofer diffraction and convolution imaging. Optical simulations verify the technique. The final design can be calculated using a simple equation. (C) 2015 Optical Society of America