Mechanistic Modeling of Architectural Vulnerability Factor
Mechanistic Modeling of Architectural Vulnerability Factor
复制标题
建筑脆弱因素的机制建模
DOI:
10.1145/2669364
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发表时间:
2015
期刊:
影响因子:
--
通讯作者:
L. Eeckhout
中科院分区:
文献类型:
--
作者:
Arun A. Nair;Stijn Eyerman;Jian Chen;L. John;L. Eeckhout
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an exponential increase in the number of transistors on chip and the reduction in operating voltages with each process generation. Architectural Vulnerability Factor (AVF) modeling using microarchitectural simulators enables architects to make informed performance, power, and reliability tradeoffs. However, such simulators are time-consuming and do not reveal the microarchitectural mechanisms that influence AVF. In this article, we present an accurate first-order mechanistic analytical model to compute AVF, developed using the first principles of an out-of-order superscalar execution. This model provides insight into the fundamental interactions between the workload and microarchitecture that together influence AVF. We use the model to perform design space exploration, parametric sweeps, and workload characterization for AVF.