Code-width testing-based compact ADC BIST circuit
Code-width testing-based compact ADC BIST circuit
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基于码宽测试的紧凑型 ADC BIST 电路
DOI：
10.1109/tcsii.2004.836034
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
Sungho Kang
中科院分区：
文献类型：
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作者：
Dongmyung Lee;Kwi;Kicheol Kim;G. Han;Sungho Kang
本文提出了一种新的基于码宽和样本差测试的模数转换器（ADC）内置自检（BIST）方案，该方案不需要斜率校准的斜坡信号。所提出的BIST方案可以通过一个简单的数字电路来实现，其门数仅为550左右。通过138个具有任意故障的6b流水线ADC测试电路的仿真验证了该方案的有效性。仿真结果表明，该方法不仅能有效地检测到突变故障，而且能检测到一些参数故障。模拟的故障覆盖率约为99%。
This paper proposes a new analog-to-digital converter (ADC) built-in self-test (BIST) scheme based on code-width and sample-difference testing that does not require a slope-calibrated ramp signal. The proposed BIST scheme can be implemented by a simple digital circuit whose gate count is only approximately 550. The proposed BIST scheme is verified by simulation with 138 test circuits of 6-b pipeline ADC with arbitrary faults. Simulation results show that it effectively detects not only the catastrophic faults but also some parametric faults. The simulated fault coverage is approximately 99%.