Two-dimensional X-ray Diffraction
Two-dimensional X-ray Diffraction
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DOI：
10.1002/9781119356080
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发表时间：
2009-08
期刊：
影响因子：
--
通讯作者：
B. He
中科院分区：
文献类型：
--
作者：
B. He
前言。1.引言。1.1 X射线技术及其简史。1.2晶体的几何形状。1.3 X射线衍射原理。1.4倒易空间和绕射。1.5二维X射线衍射法。2.几何惯例。2.1引言。2.2衍射空间和实验室坐标。2.3探测器空间和探测器几何形状。2.4样本空间和测角仪几何图形。2.5从衍射空间到样本空间的变换。2.6 XRD2几何图形摘要。参考资料。3.X射线源与光学。3.1 X射线的产生和特性。3.2 X射线光学。参考资料。4.X射线探测器。4.1 X射线探测技术的历史。4.2传统衍射计中的点探测器。4.3点探测器的特性。4.4线路探测器。4.5面积探测器的特性。4.6区域探测器的种类。5.测角仪和样品台。5.1测角器和样品位置。5.2测角仪精度。5.3样品排列和可视化系统。5.4环境阶段。参考资料。6.数据处理。6.1引言。6.2非统一响应校正。6.3空间校正。6.4探测器位置精度和校准。6.5框架集成。6.6洛伦兹、偏振和吸收修正。7.阶段识别。7.1引言。7.2相对强度。7.3几何图形和分辨率。7.4抽样统计。7.5择优取向效应。参考资料。8.纹理分析。8.1引言。8.2极点密度和极点图形。8.3基本方程。8.4数据收集策略。8.5纹理数据处理。8.6方位分布函数。8.7纤维质地。8.8 XRD2在纹理方面的其他优势。参考资料。9.应力测量。9.1引言。9.2 X射线应力分析原理。9.3用XRD2进行应力分析的理论。9.4用XRD2进行应力测量的过程。9.5实验例证。附录9.由一般应力张量计算的主应力。附录9.B应力测量参数。参考资料。10.小角X射线散射。10.1导言。10.2 2D SAXS系统。10.3应用实例。10.4二维SAXS的一些创新。参考资料。11.组合筛选。11.1导言。11.2XRD2组合筛选系统。11.3 XRD2和拉曼联合筛查。12.定量分析。结晶度为12.1%。12.2晶体尺寸。12.3残余奥氏体钢。参考资料。13.创新与未来发展。13.1引言。13.2 XRD2扫描线探测器。13.3三维探测器。13.4像素直接衍射分析。参考资料。附录A.常用参数的取值。附录B.符号。索引。
Preface. 1. Introduction. 1.1 X-Ray Technology and Its Brief History. 1.2 Geometry of Crystals. 1.3 Principles of X-Ray Diffraction. 1.4 Reciprocal Space and Diffraction. 1.5 Two-Dimensional X-Ray Diffraction. 2. Geometry Conventions. 2.1 Introduction. 2.2 Diffraction Space and Laboratory Coordinates. 2.3 Detector Space and Detector Geometry. 2.4 Sample Space and Goniometer Geometry. 2.5 Transformation from Diffraction Space to Sample Space. 2.6 Summary of XRD2 Geometry. References. 3. X-Ray Source and Optics. 3.1 X-Ray Generation and Characteristics. 3.2 X-Ray Optics. References. 4. X-Ray Detectors. 4.1 History of X-Ray Detection Technology. 4.2 Point Detectors in Conventional Diffractometers. 4.3 Characteristics of Point Detectors. 4.4 Line Detectors. 4.5 Characteristics of Area Detectors. 4.6 Types of Area Detectors. 5. Goniometer and Sample Stages. 5.1 Goniometer and Sample Position. 5.2 Goniometer Accuracy. 5.3 Sample Alignment and Visualization Systems. 5.4 Environment Stages. References. 6. Data Treatment. 6.1 Introduction. 6.2 Nonuniform Response Correction. 6.3 Spatial Correction. 6.4 Detector Position Accuracy and Calibration. 6.5 Frame Integration. 6.6 Lorentz, Polarization, and Absorption Corrections. 7. Phase Identification. 7.1 Introduction. 7.2 Relative Intensity. 7.3 Geometry and Resolution. 7.4 Sampling Statistics. 7.5 Preferred Orientation Effect. References. 8. Texture Analysis. 8.1 Introduction. 8.2 Pole Density and Pole Figure. 8.3 Fundamental Equations. 8.4 Data Collection Strategy. 8.5 Texture Data Process. 8.6 Orientation Distribution Function. 8.7 Fiber Texture. 8.8 Other Advantages of XRD2 for Texture. References. 9. Stress Measurement. 9.1 Introduction. 9.2 Principle of X-Ray Stress Analysis. 9.3 Theory of Stress Analysis with XRD2. 9.4 Process of Stress Measurement with XRD2. 9.5 Experimental Examples. Appendix 9.A Calculation of Principal Stresses from the General Stress Tensor. Appendix 9.B Parameters for Stress Measurement. References. 10. Small-Angle X-Ray Scattering. 10.1 Introduction. 10.2 2D SAXS Systems. 10.3 Application Examples. 10.4 Some Innovations in 2D SAXS. References. 11. Combinatorial Screening. 11.1 Introduction. 11.2 XRD2 Systems for Combinatorial Screening. 11.3 Combined Screening with XRD2 and Raman. 12. Quantitative Analysis. 12.1 Percent Crystallinity. 12.2 Crystal Size. 12.3 Retained Austenite. References. 13. Innovation and Future Development. 13.1 Introduction. 13.2 Scanning Line Detector for XRD2. 13.3 Three-Dimensional Detector. 13.4 Pixel Direct Diffraction Analysis. References. Appendix A. Values of Commonly Used Parameters. Appendix B. Symbols. Index.