Mechanical vs. electrical failure mechanisms in high voltage, high energy density multilayer ceramic capacitors

Mechanical vs. electrical failure mechanisms in high voltage, high energy density multilayer ceramic capacitors
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DOI:
10.1007/s10853-006-1116-2
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发表时间:
2007-04
影响因子:
4.5
通讯作者:
A. L. Young;G. Hilmas;S. Zhang;R. W. Schwartz
A. L. Young;G. Hilmas;S. Zhang;R. W. Schwartz
中科院分区:
材料科学3区
文献类型:
--
作者:
A. L. Young;G. Hilmas;S. Zhang;R. W. Schwartz

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研究了高电压、高能量密度钛酸钡电容器的机械和电学击穿原因。电容器的弯曲强度为96 MPa。失效是由于靠近样品表面的表面缺陷或孔隙。样品的介电击穿强度为181 kV/cm。击穿的原因是电极端效应或介电层和电极层之间的孔隙。使用威布尔统计来确定机械故障和介电击穿之间是否存在相关性。在研究中没有发现这两种类型的故障之间的强相关性,与早期的单电介质层电容器材料的研究相反。
Causes of breakdown, both mechanical and electrical, in high voltage, high energy density, BaTiO3capacitors were studied. The flexural strength of the capacitors was 96 MPa. Failure was due to surface defects or pores close to the surfaces of the samples. The dielectric breakdown strength of the samples was 181 kV/cm. The causes of breakdown were either electrode end effects or pores between the dielectric and electrode layers. Weibull statistics were used to determine if there was a correlation between mechanical failure and dielectric breakdown. A strong correlation between the two types of failure was not found in the study, in contrast to earlier studies of single dielectric layer capacitor materials.