Measuring liquid crystal anchoring energy strength by spectroscopic ellipsometry
Measuring liquid crystal anchoring energy strength by spectroscopic ellipsometry
复制标题
用光谱椭圆光度法测量液晶锚定能强度
DOI：
10.1063/1.3361512
复制
发表时间：
2010
影响因子：
3.2
通讯作者：
G. Abbate
中科院分区：
文献类型：
--
作者：
A. Marino;V. Tkachenko;E. Santamato;N. Bennis;X. Quintana;J. Otón;G. Abbate
本文描述了一种精确测量液晶电池锚定能量强度的实验方法。这项技术是基于利用光谱椭偏术收集大量非常精确的关于不同实验条件下细胞线性光学响应的数据的可能性。然后，利用数据反演方法进行仔细的数据分析，并辅以弹性理论的模拟，就可以提供所搜索的信息。该技术已被应用于垂直排列的向列细胞，选择在目前的显示市场上广泛使用。在这种特殊情况下获得的结果以及与现有替代技术的彻底比较表明，我们的技术可以成为这种测量的工业实施的最佳候选。给出了一个具体的算例，计算结果的精度为1.5%，准确度为10%。
We describe an experimental procedure for accurate measurement of anchoring energy strength of liquid crystal cells. This technique is based on the possibility of gathering a large amount of very precise data about the linear optical response of the cell in different experimental conditions, using spectroscopic ellipsometry. Then, a careful data analysis exploiting data inversion method, supplemented by simulations from the elastic theory, is able to provide the searched information. The technique has been applied to vertical aligned nematic cells, chosen for its widespread use in the present display market. The results obtained in this particular case together with a thorough comparison with existing alternative techniques, suggest that our technique can be an optimum candidate for the industrial implementation of such measurement. A particular example is fully worked out, giving a result with a precision of 1.5% and an accuracy of 10%.