Experimental verification of designer surface plasmons
Experimental verification of designer surface plasmons
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DOI：
10.1126/science.1109043
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发表时间：
2005-04-29
期刊：
影响因子：
56.9
通讯作者：
Sambles, JR
中科院分区：
文献类型：
--
作者：
Hibbins, AP;Evans, BR;Sambles, JR
我们研究了一个结构化的、接近完美导电的衬底的微波反射率，该衬底的设计是为了验证理论上提出的一类新的表面模式的存在。模态色散曲线的测量表明，它正确地接近于预测的渐近频率；该曲线与计算机模拟得到的曲线也很吻合。对共振场分布的建模提供了界面处强局域化电场和沿界面的大量功率流的证据，从而验证了该模式的表面等离子体性质。
We studied the microwave reflectivity of a structured, near perfectly conducting substrate that was designed to verify the existence of a theoretically proposed new class of surface mode. Measurements of the mode's dispersion curve show that it correctly approaches the predicted asymptotic frequency; the curve also agrees well with that derived from a computer simulation. Modeling of the field distribution on resonance provides evidence of strong localization of the electric field at the interface and substantial power flow along the interface, thus verifying the surface plasmon-like nature of the mode.