Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography
Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography
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DOI：
10.1016/j.matchar.2016.09.023
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发表时间：
2016-10
影响因子：
4.7
通讯作者：
C. Mayer;Jon Molina-Aladareguia;N. Chawla
中科院分区：
文献类型：
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作者：
C. Mayer;Jon Molina-Aladareguia;N. Chawla
Al-SiC纳米叠层复合材料由于其强度和韧性的结合而显示出作为高性能涂层材料的前景。虽然大量的建模工作已经集中在具有理想化的平坦纳米结构的材料上，但实验上这些材料表现出复杂的起伏层几何形状。这项工作利用FIB断层扫描来表征3D和有限元建模中的这种纳米结构，以确定这种复杂结构对这些材料的机械行为的影响。表征了足够大的体积，使得可以从数据集生成1 × 2 μm的微柱，并直接与实验结果进行比较。然后将来自该纳米结构的机械响应与使用具有完美平坦层、具有正弦波度的层和具有弧段波度的层的简化结构的柱模型进行比较。基于弧段的层几何形状与实验确定的结构显示出最佳的一致性，这表明它将是未来建模工作的最合适的几何形状。
Al-SiC nanolaminate composites show promise as high performance coating materials due to their combination of strength and toughness. Although a significant amount of modeling effort has been focused on materials with an idealized flat nanostructure, experimentally these materials exhibit complex undulating layer geometries. This work utilizes FIB tomography to characterize this nanostructure in 3D and finite element modeling to determine the effect that this complex structure has on the mechanical behavior of these materials. A sufficiently large volume was characterized such that a 1 × 2 μm micropillar could be generated from the dataset and compared directly to experimental results. The mechanical response from this nanostructure was then compared to pillar models using simplified structures with perfectly flat layers, layers with sinusoidal waviness, and layers with arc segment waviness. The arc segment based layer geometry showed the best agreement with the experimentally determined structure, indicating it would be the most appropriate geometry for future modeling efforts.