Effect of rhenium addition on deuterium retention in neutron-irradiated tungsten
Effect of rhenium addition on deuterium retention in neutron-irradiated tungsten
复制标题
添加铼对中子辐照钨中氘保留的影响
DOI：
10.1016/j.jnucmat.2022.153774
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发表时间：
2022
影响因子：
3.1
通讯作者：
Hatano Y.
中科院分区：
文献类型：
--
作者：
Nobuta Y.;Toyama T.;Matsumoto A.;Shimada M.;Oya Y.;Inoue K.;Nagai Y.;Hatano Y.
研究了铼（Re）的加入对中子辐照钨(W)中氘(D)保留的影响。纯W和W- 5re （5at）。采用mfe - rb - 19j胶囊在高通量同位素堆上进行中子辐照。纯W合金的试样温度为864 K，损伤程度为0.35 dpa； W- 5re合金的试样温度为792 K，损伤程度为0.26 dpa。部分样品在爱达荷国家实验室氚等离子体实验中暴露在823 K下5 × 1025m−2的D等离子体中。利用正电子湮没光谱（PAS）研究了中子辐照样品中的空位型缺陷；用热解吸光谱法（TDS）评价血浆暴露后D的保留。TDS测量结果显示，中子辐照后W- 5re合金的D保留率与未辐照W样品相似，而中子辐照后W的D保留率显著增加，因此，Readdition显著抑制了中子辐照后D保留率的增加。正如PAS证实的那样，这种效果归因于抑制了空缺型缺陷的形成。
The effects of rhenium (Re) addition on deuterium (D) retention in neutron-irradiated tungsten (W) were investigated. Pure W and W-5Re (5 at.%) alloy samples were irradiated with neutrons at High Flux Isotope Reactor using MFE-RB-19 J capsule. The sample temperature and the damage level were 864 K and 0.35 dpa for pure W and 792 K and 0.26 dpa for W-5Re alloy. A portion of the samples was exposed to D plasma at Tritium Plasma Experiment at Idaho National Laboratory at 823 K to a fluence of 5 × 1025m−2. Vacancy-type defects in neutron-irradiated samples were examined using positron annihilation spectroscopy (PAS); D retention after plasma exposure was evaluated by thermal desorption spectrometry (TDS).TDS measurements revealed that D retention in the neutron-irradiated W-5Re alloy was similar to that in the unirradiated W sample, whereas a significant increase in D retention was observed in neutron-irradiated W. Thus,Readdition significantly suppressed the increase in D retention after neutron irradiation. This effect was attributed to the suppression of vacancy-type defect formation, as confirmed by PAS.
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影响因子：
3.1
作者：
Jing Wang;Y. Hatano;T. Hinoki;V. Alimov;A. Spitsyn;N. Bobyr;S. Kondo;T. Toyama;Heun Tae Lee;Y. Ueda;T. Schwarz-Selinger
通讯作者：
Jing Wang;Y. Hatano;T. Hinoki;V. Alimov;A. Spitsyn;N. Bobyr;S. Kondo;T. Toyama;Heun Tae Lee;Y. Ueda;T. Schwarz-Selinger
影响因子：
3.1
作者：
M. Akiyoshi;L. Garrison;J. Geringer;Hsin Wang;A. Hasegawa;S. Nogami;Y. Katoh
通讯作者：
M. Akiyoshi;L. Garrison;J. Geringer;Hsin Wang;A. Hasegawa;S. Nogami;Y. Katoh
DOI：
10.1016/j.nimb.2008.11.045
发表时间：
2009-02-01
影响因子：
1.3
作者：
Troev, T.;Popov, E.;Yoshiie, T.
通讯作者：
Yoshiie, T.
在电子辐照钨中观察到的空位处的短正电子寿命：实验和第一原理计算
影响因子：
3.1
作者：
Yabuuchi A.;Tanaka M.;Kinomura A.
通讯作者：
Kinomura A.