Investigation of ceria by combined Raman, UV–vis and X-ray photoelectron spectroscopy
Investigation of ceria by combined Raman, UV–vis and X-ray photoelectron spectroscopy
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DOI：
10.1016/j.catcom.2012.02.009
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发表时间：
2012-05
影响因子：
3.7
通讯作者：
Christoph T. Nottbohm;C. Hess
中科院分区：
文献类型：
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作者：
Christoph T. Nottbohm;C. Hess
首次通过拉曼光谱、紫外可见分光光度计和 X 射线光电子能谱在一个实验装置中结合来研究二氧化铈粉末样品中的表面和本体氧空位缺陷。表面减少（缺陷）的分析基于 Ce3d 光发射线的变化。对于通过 X 射线照射还原的二氧化铈，紫外可见光谱显示在 500 nm 左右有电子跃迁。缺陷的性质由 832cm−1 和 3664cm−1 处过氧化物和羟基拉曼带的存在来确定。我们的结果证明了组合光谱方法对于表征位于二氧化铈表面和本体中的缺陷的潜力。
Surface and bulk oxygen vacancy defects in ceria powder samples were investigated by Raman, UV–vis and X-ray photoelectron spectroscopy combined in one experimental setup for the first time. Analysis of surface reduction (defects) is based on changes in Ce3d photoemission lines. For ceria reduced by X-ray exposure UV–vis spectra reveal an electronic transition at around 500nm. The nature of the defects is specified by the presence of peroxide and hydroxy Raman bands at 832cm−1and 3664cm−1. Our results demonstrate the potential of a combined spectroscopic approach for characterization of defects located at the surface and in the bulk of ceria.