Quantitative local profile analysis of nanomaterials by electron diffraction
Quantitative local profile analysis of nanomaterials by electron diffraction
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DOI：
10.1016/j.scriptamat.2010.04.019
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发表时间：
2010-08-01
影响因子：
6
通讯作者：
Karnthaler, H. P.
中科院分区：
文献类型：
--
作者：
Gammer, C.;Mangler, C.;Karnthaler, H. P.
从电子衍射产生的定量轮廓分析的方法，并结合从透射电子显微镜图像获得的局部信息，它适用于各种纳米材料。作为一个例子，小的纳米晶区域进行了分析，形成在FeAl严重的塑性变形。结果是出乎意料的，因为相干散射域尺寸不作为应变的函数而改变。在高应变下，样品为均匀的纳米晶结构，其结果与X射线衍射结果一致。(C)2010 Acta Materialia Inc.由爱思唯尔有限公司出版。保留所有权利。
A method yielding a quantitative profile analysis from electron diffraction is worked out and combined with the local information gained from transmission electron microscopy images; it is applicable to various nanomaterials. As an example, small nanocrystalline regions are analyzed that form in FeAl by severe plastic deformation. The result is unexpected as the coherently scattering domain size does not change as a function of strain. At high strains, the sample is homogeneously nanocrystalline and the results agree well with those of X-ray diffraction. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.