Radio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope
Radio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope
复制标题
DOI：
10.1063/1.5119888
复制
发表时间：
2019-12-01
影响因子：
1.6
通讯作者：
Giessibl, Franz
中科院分区：
文献类型：
--
作者：
Peronio, Angelo;Okabayashi, Norio;Giessibl, Franz
非弹性电子隧道光谱（IETS）也用于基于扫描隧道显微镜和原子力显微镜（AFM）的IET光谱，使我们能够测量单个分子的振动能量以及显微镜尖端施加的力，这加深了我们对尖端与表面分子之间相互作用的理解。 IETS 的分辨率是确定分子振动能量的关键因素。然而，来自环境的射频 (RF) 噪声会显着降低分辨率。我们引入了一种射频噪声过滤技术，该技术可实现高分辨率 IETS，同时保持不受影响的 AFM 性能，这一点通过铜表面 CO 分子的振动测量得到了证明。由 AIP Publishing 许可发布。
The combination of inelastic electron tunneling spectroscopy (IETS), also used for IET spectrum based on scanning tunneling microscopy with atomic force microscopy (AFM) enables us to measure the vibrational energies of a single molecule along with the force exerted by the tip of a microscope, which deepens our understanding on the interaction between the tip and the molecule on a surface. The resolution of IETS is a crucial factor in determining the vibrational energies of a molecule. However, radio frequency (RF) noise from the environment significantly deteriorates the resolution. We introduce an RF noise filtering technique, which enables high resolution IETS while maintaining uncompromised AFM performance, demonstrated by vibrational measurements of a CO molecule on a copper surface. Published under license by AIP Publishing.