Detection of X-ray Induced Current Using a Scanning Tunneling Microscope and its Spatial Mapping for Elemental Analysis
Detection of X-ray Induced Current Using a Scanning Tunneling Microscope and its Spatial Mapping for Elemental Analysis
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使用扫描隧道显微镜检测 X 射线感应电流及其用于元素分析的空间映射
DOI：
10.1143/jjap.37.l1271
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发表时间：
1998
影响因子：
1.5
通讯作者：
T. Sakurai
中科院分区：
文献类型：
--
作者：
K. Tsuji;Y. Hasegawa;K. Wagatsuma;T. Sakurai
通过使用外部X射线源的光电子能谱，超真空扫描隧道显微镜（UHV-STM）被成功地用于检测和映射由X射线照射引起的尖端电流同时与隧道电流。在Au/Cu（111）和Si（111）7×7表面上的X射线感生电流使STM图像中的视高度升高。STM图像中Au覆盖层相对于Cu基底的相对高度增加被发现依赖于X射线照射，这表明它可能是STM中元素分析的一个有前途的工具。
By using an external X-ray source for photoemission, an ultrahigh vacuum scanning tunneling microscope (UHV-STM) was successfully used to detect and map a tip current induced by X-ray irradiation simultaneously with a tunneling current. Apparent height in the STM image rises by the X-ray induced current on the Au/Cu(111) and Si(111)7×7 surfaces. Relative height increase of the Au overlayer to Cu substrate in STM images was found to depend on the X-ray irradiation, suggesting that it may be a promising tool for elemental analysis in STM.