Identifying ferroelectric phase and domain structure using angle-resolved piezoresponse force microscopy
Identifying ferroelectric phase and domain structure using angle-resolved piezoresponse force microscopy
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DOI：
10.1063/1.4869554
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发表时间：
2014-03-24
影响因子：
4
通讯作者：
Huber, J. E.
中科院分区：
文献类型：
--
作者：
Kim, K. L.;Huber, J. E.
我们使用角分辨piezoresponse力显微镜（AR-PFM），垂直PFM（VPFM），和电子背散射衍射（EBSD）提供了一个系统的解释域模式多晶，近morphotropic锆钛酸铅。该材料用于说明AR-PFM方法在解决可能存在多个相位的复杂域模式中的能力。AR-PFM进行了30度的旋转间隔，并分析所得到的数据，以确定潜在的压电轴的方向。AR-PFM提供的额外信息进行了研究，比较其能力的三维PFM，包括一个VPFM图像和两个正交的横向PFM（LPFM）的图像。我们表明，在一定条件下，使用AR-PFM可以识别在亚晶粒尺度上存在的相。这一点得到了VPFM和EBSD数据的证实。此外，该方法可以区分在VPFM中看起来类似的层压畴图案，并且可以可靠地暴露在来自单个取向的LPFM数据中或甚至在3D PFM数据中可能看不到的畴图案。(C)2014 AIP Publishing LLC.
We used angle-resolved piezoresponse force microscopy (AR-PFM), vertical PFM (VPFM), and electron backscatter diffraction (EBSD) to provide a systematic interpretation of domain patterns in polycrystalline, near-morphotropic lead zirconate titanate. This material was used to illustrate the power of AR-PFM methods in resolving complex domain patterns where multiple phases may be present. AR-PFM was carried out with a 30 degrees rotation interval, and the resulting data were analysed to identify the orientation of the underlying axis of piezoelectricity. The additional information provided by AR-PFM was studied, comparing its capabilities to those of 3-dimensional PFM, consisting of one VPFM image and two orthogonal lateral PFM (LPFM) images. We show that, in certain conditions, using AR-PFM can identify the phases present at the sub-grain scale. This was confirmed using VPFM and EBSD data. Furthermore, the method can discriminate laminated domain patterns that appear similar in VPFM and can reliably expose domain patterns that may not be seen in LPFM data from a single orientation, or even in 3D PFM data. (C) 2014 AIP Publishing LLC.