A DFT method for data paths based on partially strong testability to guarantee complete fault efficiency

A DFT method for data paths based on partially strong testability to guarantee complete fault efficiency
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保证完全故障效率的基于部分强可测性的数据路径DFT方法

DOI:
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发表时间:
2005
期刊:
IEEE the 14th Asian Test Symposium
影响因子:
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通讯作者:
Hideo Fujiwara
Hideo Fujiwara
中科院分区:
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文献类型:
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作者:
Hiroyuki lwata;Tomokazu Yoneda;Satoshi Ohtake;Hideo Fujiwara

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