Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples
Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples
复制标题
任意应变样品中德拜-谢勒衍射图案的预测
DOI：
10.1063/1.4874656
复制
发表时间：
2013
影响因子：
3.2
通讯作者：
D. McGonegle
中科院分区：
文献类型：
--
作者：
A. Higginbotham;D. McGonegle
应变样品的德拜-谢勒衍射图的预测通常是在小应变极限下进行的。虽然这一断言适用于与静水器的小偏差(例如，通常在钻石砧座单元中观察到的有限强度条件)，但对于在单轴加载动态压缩实验中发现的大应变各向异性(通常在法向应变中约为10%)，这一断言很可能是无效的。本文导出了任意形变的多晶样品在任意几何形状和晶体对称性下的(θB，ϕ)依赖关系的一般形式。结果表明，该公式与计算产生的高应变多晶体的光线跟踪衍射是一致的，并且与已报道的广泛使用的小应变解有偏差。
The prediction of Debye-Scherrer diffraction patterns from strained samples is typically conducted in the small strain limit. Although valid for small deviations from the hydrostat (such as the conditions of finite strength typically observed in diamond anvil cells) this assertion is likely to fail for the large strain anisotropies (often of order 10% in normal strain) found in uniaxially loaded dynamic compression experiments. In this paper, we derive a general form for the (θB,ϕ) dependence of the diffraction for an arbitrarily deformed polycrystalline sample in any geometry, and of any crystal symmetry. We show that this formula is consistent with ray traced diffraction for highly strained computationally generated polycrystals, and that the formula shows deviations from the widely used small strain solutions previously reported.
影响因子：
41.2
作者：
Loa, I.;Nelmes, R. J.;McMahon, M. I.
通讯作者：
McMahon, M. I.