Where Are the X-Ray Event Grades Formed Inside the Pixel of the Charge-Coupled Device? The Behavior of the Primary Charge Cloud Inside the Charge-Coupled Device
Where Are the X-Ray Event Grades Formed Inside the Pixel of the Charge-Coupled Device? The Behavior of the Primary Charge Cloud Inside the Charge-Coupled Device
复制标题
电荷耦合器件像素内部的 X 射线事件等级在哪里形成？
DOI：
10.1143/jjap.37.2734
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发表时间：
1998
影响因子：
1.5
通讯作者：
andShunji Kitamoto
中科院分区：
文献类型：
--
作者：
H. Tsunemi;J. Hiraga;K. Yoshita;andShunji Kitamoto
我们报告了使用一种改进的技术来测量亚像素分辨率的电荷耦合器件（CCD）的x射线探测效率。该技术利用平行x射线束和金属网紧密放置在CCD上。网格有许多圆孔，间距是CCD像素大小的4倍（多间距网格）。我们可以在单个事件和分割像素事件中确定x射线的相互作用位置。通过这种方法，我们演示了各种类型的x射线事件是如何在CCD内部形成的。我们已经表明，两个像素的分裂事件是在像素边界附近形成的。我们清楚地表明，当交互作用位置靠近像素角时，形成了三像素事件，而当交互作用位置更接近像素角时，形成了四像素分裂事件。我们发现分裂事件的重心可以代表交互作用位置，不确定性为0.13像素大小。
We report the use of an improved technique to measure the X-ray detection efficiency of a charge-coupled device (CCD) with a subpixel resolution. This technique makes use of a parallel X-ray beam and metal mesh placed closely on the CCD. The mesh has many circular holes spaced at distance of 4 times the CCD pixel size (multi-pitch mesh). We could identify the interaction position of X-rays both for single events and for split pixel events. By using this method, we demonstrated how various types of X-ray events are formed inside the CCD. We have already shown that the two-pixel split events were formed near the pixel boundary. We clearly showed that the three-pixel events were formed when the interaction position was close to the pixel corner, whereas the four-pixel split events were formed when the interaction position was much closer to the pixel corner. We found that the center of gravity of split events could represent the interaction position with an uncertainty of 0.13 pixel size.