Ferromagnetic resonance of sputtered yttrium iron garnet nanometer films
Ferromagnetic resonance of sputtered yttrium iron garnet nanometer films
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DOI：
10.1063/1.4852135
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发表时间：
2014-05-07
影响因子：
3.2
通讯作者：
Wu, Mingzhong
中科院分区：
文献类型：
--
作者：
Liu, Tao;Chang, Houchen;Wu, Mingzhong
采用溅射法制备了纳米级的钇铁石榴石（YIG）薄膜，并研究了薄膜的铁磁共振（FMR）特性。随着薄膜厚度从几纳米增加到100 nm左右，YIG薄膜的铁磁电阻线宽减小。对于具有非常光滑表面的膜，线宽随频率线性增加。相反，对于大晶粒的薄膜，线宽-频率响应是强非线性的。在7-26 nm厚度范围内的膜显示出0.1 nm和0.4 nm之间的表面粗糙度，在6- 10 Oe范围内的9.48-GHz FMR线宽，以及约0.001的阻尼常数。(C)2014 AIP Publishing LLC.
Growth of nm-thick yttrium iron garnet (YIG) films by sputtering and ferromagnetic resonance (FMR) properties in the films were studied. The FMR linewidth of the YIG film decreased as the film thickness was increased from several nanometers to about 100 nm. For films with very smooth surfaces, the linewidth increased linearly with frequency. In contrast, for films with big grains on the surface, the linewidth-frequency response was strongly nonlinear. Films in the 7-26 nm thickness range showed a surface roughness between 0.1 nm and 0.4nm, a 9.48-GHz FMR linewidth in the 6-10Oe range, and a damping constant of about 0.001. (C) 2014 AIP Publishing LLC.