Deceleration and electrostatic trapping of OH radicals.
Deceleration and electrostatic trapping of OH radicals.
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DOI：
10.1103/physrevlett.94.023004
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发表时间：
2004-07
影响因子：
8.6
通讯作者：
S. V. D. van de Meerakker;P. Smeets;N. Vanhaecke;R. Jongma;G. Meijer
中科院分区：
文献类型：
--
作者：
S. V. D. van de Meerakker;P. Smeets;N. Vanhaecke;R. Jongma;G. Meijer
使用斯塔克减速器使基态OH自由基的脉冲束减速，随后将其加载到静电阱中。分子束的生产，减速和陷阱加载过程的表征是通过四极阱内的激光诱导荧光检测进行的。取决于陷阱装载顺序的细节，通常10（5）OH（X2 Pi（3/2），J=3/2）自由基以约10（7）cm（-3）的密度和在50-500 mK范围内的温度被捕获。1/e陷阱寿命约为1.0 s。
A pulsed beam of ground state OH radicals is slowed down using a Stark decelerator and is subsequently loaded into an electrostatic trap. Characterization of the molecular beam production, deceleration, and trap loading process is performed via laser induced fluorescence detection inside the quadrupole trap. Depending on the details of the trap loading sequence, typically 10(5) OH (X2Pi(3/2),J=3/2) radicals are trapped at a density of around 10(7) cm(-3) and at temperatures in the 50-500 mK range. The 1/e trap lifetime is around 1.0 s.