Observation of surface reduction of NiO to Ni by surface-sensitive total reflection X-ray spectroscopy using Kramers–Kronig relations
Observation of surface reduction of NiO to Ni by surface-sensitive total reflection X-ray spectroscopy using Kramers–Kronig relations
复制标题
使用 Kramers-Kronig 关系通过表面敏感全反射 X 射线光谱观察 NiO 表面还原为 Ni
DOI：
10.7567/jjap.55.062401
复制
发表时间：
2016
影响因子：
1.5
通讯作者：
M. Nomura
中科院分区：
文献类型：
--
作者：
H. Abe;T. Nakayama;Y. Niwa;H. Nitani;H. Kondoh;M. Nomura
我们开发了一种有前景的表面敏感的X射线吸收精细结构（XAFS）测量方法。该方法基于全反射检测和克拉默斯 - 克勒尼希关系，并被命名为KK - XAFS方法。通过克拉默斯 - 克勒尼希关系对全反射光谱进行变换以获得XAFS光谱。KK - XAFS实验为我们提供表面敏感的结构参数，而常规的扩展X射线吸收精细结构（EXAFS）分析得出体相结构参数。全反射光谱本身对于通过快速扫描测量来观察和讨论表面化学反应的时间演化是有用的。对化学物种进行分析以估计它们在反应过程中的比例。整个方法将被命名为全反射X射线光谱法（TREXS）。在实验室自制的TREXS原位池中观察到了镍（30纳米）/硅表面的氧化镍层的还原。该方法可应用于观察从表面开始的化学反应以及研究它们的动力学和机制。
We have developed a promising surface-sensitive X-ray absorption fine structure (XAFS) measurement method. This method is based on total reflection detection and Kramers–Kronig relations, and has been named the KK-XAFS method. Total reflection spectra are transformed via Kramers–Kronig relations to obtain XAFS spectra. KK-XAFS experiments give us surface-sensitive structural parameters, while usual EXAFS analyses yield bulk structural parameters. The total reflection spectra themselves are useful for observing and discussing time evolutions of chemical reactions at surfaces by quick scanning measurements. Chemical species are analyzed to estimate their fractions during reactions. The whole method would be named total reflection X-ray spectroscopy (TREXS). A reduction of the NiO layer at the surface of Ni (30 nm)/Si was observed in a laboratory-built TREXS in situ cell. The method would be applicable to observe chemical reactions starting at surfaces and to study their kinetics and mechanisms.