Investigation of Photoexcited Carrier Dynamics in Hematite and the Effect of Surface Modifications by an Advanced Transient Grating Technique

Investigation of Photoexcited Carrier Dynamics in Hematite and the Effect of Surface Modifications by an Advanced Transient Grating Technique
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DOI:
10.1021/acsomega.7b00021
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发表时间:
2017-03
期刊:
影响因子:
4.1
通讯作者:
W. Sohn;S. Kuwahara;James E. Thorne;Dunwei Wang;K. Katayama
W. Sohn;S. Kuwahara;James E. Thorne;Dunwei Wang;K. Katayama
中科院分区:
化学3区
文献类型:
--
作者:
W. Sohn;S. Kuwahara;James E. Thorne;Dunwei Wang;K. Katayama

文献摘要

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利用外差瞬态光栅法研究了表面有无非晶NiFeOx的赤铁矿薄膜中光激发载流子的动力学。我们发现,两种不同的电子/空穴动力学发生在微米和毫秒的时间区域,并成功地分配每个组件的电子和空穴被困在表面状态的衰变过程中,分别。它还表明,非晶NiFeOx涂层中起着至关重要的作用,在增加的表面陷阱态,这是由表面复合率的下降造成的空穴的生存。
Photoexcited carrier dynamics in a hematite film with and without amorphous NiFeOx on the surface was investigated using the heterodyne transient grating method. We found that two different electron/hole dynamics took place in the micro- and millisecond time regions and successfully assigned each component to the decay processes of electrons and holes trapped at surface states, respectively. It was also demonstrated that the amorphous NiFeOx coating plays a crucial role in increasing the survival of the holes at the surface trap states, which was caused by the decrease in the surface recombination rate.