XRD and XPS analysis of laser treated vanadium oxide thin films
XRD and XPS analysis of laser treated vanadium oxide thin films
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DOI：
10.1016/j.apsusc.2009.04.069
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发表时间：
2009-09
影响因子：
6.7
通讯作者：
S. Beke;L. Kőrösi;S. Papp;A. Oszkó;L. Nánai
中科院分区：
文献类型：
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作者：
S. Beke;L. Kőrösi;S. Papp;A. Oszkó;L. Nánai
在这项工作中，我们提出了X射线光电子能谱（XPS）和X射线衍射（XRD）分析激光处理的氧化钒溶胶。通过透射电子显微镜（TEM）和扫描电子显微镜（SEM）观察了薄膜的形貌，揭示了在激光辐照下，干凝胶结构如何转变为不规则形状的层状结构V2 O 5。XRD分析表明，当功率密度高于102 W/cm 2时，薄膜中原有的干凝胶结构消失，当功率密度高于129 W/cm 2时，薄膜完全转变为正交晶系的多晶结构。XPS谱表明，O/V比增加，通过使用更高的激光强度。
In this work, we present X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analysis of laser treated vanadium oxide sols. The films were also observed by transmission electron microscopy (TEM) and scanning electron microscopy (SEM) to reveal how the original xerogel structure changes into irregular shaped, layer structured V2O5due to the laser radiation. XRD revealed that above 102W/cm2the original xerogel structure disappears and above 129W/cm2the films become totally polycrystalline with an orthorhombic structure. XPS spectra showed O/V ratio increment by using higher laser intensities.